兰州理工大学学报

兰州理工大学学报 ›› 2023, Vol. 49 ›› Issue (3): 104-108.

• 自动化技术与计算机技术 • 上一篇    下一篇

微控制器硅后全自动验证系统的设计

何继爱*, 苟斌   

  1. 兰州理工大学 计算机与通信学院, 甘肃 兰州 730050
  • 收稿日期:2021-08-12 出版日期:2023-06-28 发布日期:2023-07-07
  • 通讯作者: 何继爱(1969-),男,甘肃靖远人,教授. Email:hejiai@lut.edu.cn
  • 基金资助:
    国家自然科学基金(61561031)

Design of a fully automatic verification system for microcontroller after silicon

HE Ji-ai, GOU Bin   

  1. School of Computer and Communication, Lanzhou Univ. of Tech., Lanzhou 730050, China
  • Received:2021-08-12 Online:2023-06-28 Published:2023-07-07

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摘要： 硅后验证是寻找硅前阶段逃逸错误的关键环节,随着微控制器复杂性的提高,面对大量的测试用例和参数,使该过程变得低效且耗时.针对该问题,提出一个基于上下位机协同实现的微控制器硅后全自动验证系统.系统下位机为待测硬件平台,上位机在Unittest基础上设计了TLV(type-length-value)报文协议,用Pyvisa和Saleae库实现了示波器和逻辑分析仪的自动控制,用HTMLTestRunner库生成可视化测试报告,用Unittest实现了一键全自动化回归和控制.使用结果表明,该系统测试成本低,测试效率高,复用性强.

关键词: 硅后验证, Unittest, 自动控制, 回归测试

Abstract: Post-silicon verification plays a significant role in the pre-silicon procedure, which can find out the escape errors accurately. As the complexity of microcontrollers increases, there exists a large number of test cases and parameters, which makes the process inefficient and time-consuming. The use of automated system management and regression testing is an effective method. A fully automatic post-silicon verification system of microcontrollers based on the cooperation of epigynous and hypogynous machines is proposed. The hypogynous machine of system is the hardware platform to be tested. The epigynous machine designs the TLV (type-length-value) message protocol based on Unittest, and the automatic control of oscilloscopes and logic analyzers are realized through Pyvisa and Saleae libraries. The HTMLTestRunner library is used to generate visual test reports, and one-button automatic regression and control are realized by using Unittest. The advantages of the system are low-test cost, high test efficiency, and strong reusability.

Key words: post-silicon verification, Unittest, auto-control, regression testing

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