HE Ji-ai, GOU Bin. Design of a fully automatic verification system for microcontroller after silicon[J]. Journal of Lanzhou University of Technology, 2023, 49(3): 104-108.
[1] KONO T,TAITO Y,HIDAKA H,et al.Essential roles,challenges and development of embedded MCU micro-systems to innovate edge computing for the IoT/AI age[J].IEICE Transactions on Electronics,2020,103(4):132-143. [2] ZHANG L,WU H.Application of single chip technology in internet of things electronic products[J].Journal of Intelligent and Fuzzy Systems,2021,40(2):3223-3233. [3] SURYASARMAN V M,BISWAS S,SAHU A.Automation of test program synthesis for processor post-silicon validation[J].Journal of Electronic Testing,2018,34(1):1-21. [4] MITRA S,SESHIA S A,NICOLICI N.Post-silicon validation opportunities,challenges and recent advances[C]//Design Automation Conference.[S.l.]:IEEE,2010:12-17. [5] AGALYA R,SARAVANAN S.Recent trends on Post-Silicon validation and debug: An overview[C]//2017 International Conference on Networks & Advances in Computational Technologies.Trivandrum:IEEE,2017:56-63. [6] MOHARIKAR P,GUDDETI J.Automated test generation for post silicon microcontroller validation [C/OL].[2021-06-10].https://ieeexplore.org/stmp/stmp.jsp?tp=&arnumber=8167462&tag=1. [7] KANSAL A,SINHA R,JAISWAL R.Fully automated regression tool for post silicon validation[C]//2017 8th International Conference on Computing,Communication and Networking Technologies (ICCCNT).Delhi:IEEE Computer Society,2017. [8] The Python Standard Library.25.development tools [DB/OL].[2021-06-10].https://docs.python.org/2.7/library/unittest.html.