Journal of Lanzhou University of Technology ›› 2023, Vol. 49 ›› Issue (3): 104-108.

• Automation 'Technique and Computer 'Technology. • Previous Articles     Next Articles

Design of a fully automatic verification system for microcontroller after silicon

HE Ji-ai, GOU Bin   

  1. School of Computer and Communication, Lanzhou Univ. of Tech., Lanzhou 730050, China
  • Received:2021-08-12 Online:2023-06-28 Published:2023-07-07

Abstract: Post-silicon verification plays a significant role in the pre-silicon procedure, which can find out the escape errors accurately. As the complexity of microcontrollers increases, there exists a large number of test cases and parameters, which makes the process inefficient and time-consuming. The use of automated system management and regression testing is an effective method. A fully automatic post-silicon verification system of microcontrollers based on the cooperation of epigynous and hypogynous machines is proposed. The hypogynous machine of system is the hardware platform to be tested. The epigynous machine designs the TLV (type-length-value) message protocol based on Unittest, and the automatic control of oscilloscopes and logic analyzers are realized through Pyvisa and Saleae libraries. The HTMLTestRunner library is used to generate visual test reports, and one-button automatic regression and control are realized by using Unittest. The advantages of the system are low-test cost, high test efficiency, and strong reusability.

Key words: post-silicon verification, Unittest, auto-control, regression testing

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